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HBr/O2 plasma treatment followed by a bake for photoresist linewidth roughness smoothing
Fouchier, M., Pargon, E.Volume:
115
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4865799
Date:
February, 2014
File:
PDF, 2.97 MB
english, 2014