Nanocrystal characterization by ellipsometry in porous...

Nanocrystal characterization by ellipsometry in porous silicon using model dielectric function

Petrik, Peter, Fried, Miklos, Vazsonyi, Eva, Basa, Peter, Lohner, Tivadar, Kozma, Peter, Makkai, Zsolt
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Volume:
105
Year:
2009
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3068479
File:
PDF, 833 KB
english, 2009
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