Nanocrystal characterization by ellipsometry in porous silicon using model dielectric function
Petrik, Peter, Fried, Miklos, Vazsonyi, Eva, Basa, Peter, Lohner, Tivadar, Kozma, Peter, Makkai, ZsoltVolume:
105
Year:
2009
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3068479
File:
PDF, 833 KB
english, 2009