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[IEEE 2012 Joint 6th Intl. Conference on Soft Computing and Intelligent Systems (SCIS) and 13th Intl. Symposium on Advanced Intelligent Systems (ISIS) - Kobe, Japan (2012.11.20-2012.11.24)] The 6th International Conference on Soft Computing and Intelligent Systems, and The 13th International Symposium on Advanced Intelligence Systems - Analysis of backscatter from chipless metal patch RFID using soft computing techniques
Chiba, Kyohei, Chakraborty, Goutam, Mukherjee, SomnathYear:
2012
Language:
english
DOI:
10.1109/SCIS-ISIS.2012.6505075
File:
PDF, 793 KB
english, 2012