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[IEEE 2010 IEEE International Carnahan Conference on Security Technology (ICCST) - San Jose, CA, USA (2010.10.5-2010.10.8)] 44th Annual 2010 IEEE International Carnahan Conference on Security Technology - A study of users' acceptance and satisfaction of biometric systems
El-Abed, Mohamad, Giot, Romain, Hemery, Baptiste, Rosenberger, ChristopheYear:
2010
Language:
english
DOI:
10.1109/CCST.2010.5678678
File:
PDF, 726 KB
english, 2010