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Automatic Crystallographic Characterization in a Transmission Electron Microscope: Applications to Twinning Induced Plasticity Steels and Al Thin Films
Galceran, M., Albou, A., Renard, K., Coulombier, M., Jacques, P.J., Godet, S.Volume:
19
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927613000445
Date:
June, 2013
File:
PDF, 463 KB
english, 2013