Investigating and modeling impact ionization current in...

Solid-State Electronics 2014 / 04 Vol. 94

Investigating and modeling impact ionization current in MOSFETs

Chau, Quan
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Volume:
94
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2014.02.009
Date:
April, 2014
File:
PDF, 497 KB
english, 2014
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