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Modelling the threshold voltage of deep-submicrometer fully depleted SOI MOSFETs
Wang, Hongmei, Xi, Xuemei, Zhang, Xing, Wang, YangyuanVolume:
33
Year:
1997
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:19970936
File:
PDF, 257 KB
english, 1997