[IEEE 2010 68th Annual Device Research Conference (DRC) -...

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[IEEE 2010 68th Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2010.06.21-2010.06.23)] 68th Device Research Conference - Fabrication of axially-doped silicon nanowire tunnel FETs and characterization of tunneling current

Vallett, Aaron L., Minassian, Sharis, Datta, Suman, Redwing, Joan M., Mayer, Theresa S.
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Year:
2010
Language:
english
DOI:
10.1109/drc.2010.5551962
File:
PDF, 566 KB
english, 2010
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