Contact-Free Scanning and Imaging with the Scanning Ion Conductance Microscope
Del Linz, Samantha, Willman, Eero, Caldwell, Matthew, Klenerman, David, Fernández, Anibal, Moss, GuyVolume:
86
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac402748j
Date:
March, 2014
File:
PDF, 2.67 MB
english, 2014