Characterization of Ta-Ti Thin Films by using a Scanning Droplet Cell in Combination with AC Linear Sweep Voltammetry
Fan, Mu, Sliozberg, Kirill, La Mantia, Fabio, Miyashita, Naoko, Hagymási, Marcel, Schnitter, Christoph, Ludwig, Alfred, Schuhmann, WolfgangVolume:
1
Language:
english
Journal:
ChemElectroChem
DOI:
10.1002/celc.201300153
Date:
May, 2014
File:
PDF, 1.53 MB
english, 2014