![](/img/cover-not-exists.png)
Variation of Oxygen Deficiency in Solution-Processed Ultra-Thin Zinc-Tin Oxide Films to Their Transistor Characteristics
Liu, L.-C., Chen, J.-S., Jeng, J.-S., Chen, W.-Y.Volume:
2
Language:
english
Journal:
ECS Journal of Solid State Science and Technology
DOI:
10.1149/2.022304jss
Date:
February, 2013
File:
PDF, 2.33 MB
english, 2013