Variation of Oxygen Deficiency in Solution-Processed...

ECS Journal of Solid State Science and Technology 2013 / 02 Vol. 2; Iss. 4

Variation of Oxygen Deficiency in Solution-Processed Ultra-Thin Zinc-Tin Oxide Films to Their Transistor Characteristics

Liu, L.-C., Chen, J.-S., Jeng, J.-S., Chen, W.-Y.
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Volume:
2
Language:
english
Journal:
ECS Journal of Solid State Science and Technology
DOI:
10.1149/2.022304jss
Date:
February, 2013
File:
PDF, 2.33 MB
english, 2013
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