Sample preparation for scanning Kelvin probe microscopy...

Sample preparation for scanning Kelvin probe microscopy studies on cross sections of organic solar cells

Scherer, Michael, Saive, Rebecca, Daume, Dominik, Kröger, Michael, Kowalsky, Wolfgang
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Volume:
3
Year:
2013
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4824323
File:
PDF, 1005 KB
english, 2013
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