Metrological characterization of X-ray diffraction methods...

Materials Characterization 2013 / 11 Vol. 85

Metrological characterization of X-ray diffraction methods at different acquisition geometries for determination of crystallite size in nano-scale materials

Uvarov, Vladimir, Popov, Inna
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Volume:
85
Language:
english
Journal:
Materials Characterization
DOI:
10.1016/j.matchar.2013.09.002
Date:
November, 2013
File:
PDF, 1.73 MB
english, 2013
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