[IEEE 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - Las Vegas, NV, USA (2010.06.2-2010.06.5)] 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems - Validation of an advanced fan model with multiple reference frame approach
Shankaran, Gokul V., Dogruoz, M. BarisYear:
2010
Language:
english
DOI:
10.1109/itherm.2010.5501404
File:
PDF, 2.28 MB
english, 2010