Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2012 Vol. 30; Iss. 5
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Studies on InAs/GaSb superlattice structural properties by high resolution x-ray diffraction
Zhou, Yi, Chen, Jianxin, Xu, Qingqing, He, LiVolume:
30
Year:
2012
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.4739428
File:
PDF, 1.09 MB
english, 2012