Real-time, high-resolution x-ray diffraction measurements on shocked crystals at a synchrotron facility
Gupta, Y. M., Turneaure, Stefan J., Perkins, K., Zimmerman, K., Arganbright, N., Shen, G., Chow, P.Volume:
83
Year:
2012
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4772577
File:
PDF, 2.38 MB
english, 2012