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Structural characterisation of BaTiO3 thin films deposited on SrRuO3/YSZ buffered silicon substrates and silicon microcantilevers
Colder, H., Domengès, B., Jorel, C., Marie, P., Boisserie, M., Guillon, S., Nicu, L., Galdi, A., Méchin, L.Volume:
115
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4863542
Date:
February, 2014
File:
PDF, 3.75 MB
english, 2014