Structural characterisation of BaTiO3 thin films deposited...

Journal of Applied Physics 2014 / 02 Vol. 115; Iss. 5

Structural characterisation of BaTiO3 thin films deposited on SrRuO3/YSZ buffered silicon substrates and silicon microcantilevers

Colder, H., Domengès, B., Jorel, C., Marie, P., Boisserie, M., Guillon, S., Nicu, L., Galdi, A., Méchin, L.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
115
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4863542
Date:
February, 2014
File:
PDF, 3.75 MB
english, 2014
Conversion to is in progress
Conversion to is failed