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[ACM Press the 42nd annual conference - San Diego, California, USA (2005.06.13-2005.06.17)] Proceedings of the 42nd annual conference on Design automation - DAC '05 - Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance
Srivastava, Ashish, Shah, Saumil, Agarwal, Kanak, Sylvester, Dennis, Blaauw, David, Director, StephenYear:
2005
Language:
english
DOI:
10.1145/1065579.1065718
File:
PDF, 1.20 MB
english, 2005