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Time-resolved conductance and reflectance measurements of silicon during pulsed-laser annealing
Galvin, G. J., Thompson, Michael O., Mayer, J. W., Peercy, P. S., Hammond, R. B., Paulter, N.Volume:
27
Language:
english
Journal:
Physical Review B
DOI:
10.1103/physrevb.27.1079
Date:
January, 1983
File:
PDF, 397 KB
english, 1983