Reliability modeling of TCR–FC type SVC using Markov...

Reliability modeling of TCR–FC type SVC using Markov process

Karami-Horestani, AliReza, Hamedani Golshan, Mohamad Esmail, Hajian-Hoseinabadi, Hamze
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Volume:
55
Language:
english
Journal:
International Journal of Electrical Power & Energy Systems
DOI:
10.1016/j.ijepes.2013.09.010
Date:
February, 2014
File:
PDF, 1.06 MB
english, 2014
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