Voltage Dependency of Propagating Single-Event Transient...

IEEE Transactions on Device and Materials Reliability 2014 / 3 Vol. 14; Iss. 1

Voltage Dependency of Propagating Single-Event Transient Pulsewidths in 90-nm CMOS Technology

Junrui Qin,, Shuming Chen,, Bin Liang,, Zhen Ge,, Yibai He,, Yankang Du,, Biwei Liu,, Jianjun Chen,, Dawei Li,
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Volume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2013.2255597
Date:
March, 2014
File:
PDF, 251 KB
english, 2014
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