[Institution of Engineering and Technology IET International Radar Conference 2013 - Xi'an, China (14-16 April 2013)] IET International Radar Conference 2013 - A method to reduce sensitivity of fabrication errors in design of proximity-coupled cavity-backed stacked patches antenna
Dan Sun,, Wenbin Dou,, Zhaocheng Zhang,Year:
2013
Language:
english
DOI:
10.1049/cp.2013.0443
File:
PDF, 1.09 MB
english, 2013