AC Bias-Temperature Stability of a-InGaZnO Thin-Film...

IEEE Transactions on Electron Devices 2014 / 03 Vol. 61; Iss. 3

AC Bias-Temperature Stability of a-InGaZnO Thin-Film Transistors With Metal Source/Drain Recessed Electrodes

Yu, Eric Kai-Hsiang, Abe, Katsumi, Kumomi, Hideya, Kanicki, Jerzy
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2014.2302411
Date:
March, 2014
File:
PDF, 1.98 MB
english, 2014
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