[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Path-delay fingerprinting for identification of recovered ICs
Zhang, Xuehui, Xiao, Kan, Tehranipoor, MohammadYear:
2012
Language:
english
DOI:
10.1109/dft.2012.6378192
File:
PDF, 490 KB
english, 2012