SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, USA (Saturday 2 February 2013)] Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XX - A comparison of methods for optical sectioning using structured illumination microscopy
Cogswell, Carol J., Thomas, Benjamin, Momany, Michelle, Brown, Thomas G., Conchello, Jose-Angel, Kner, Peter, Wilson, TonyVolume:
8589
Year:
2013
Language:
english
DOI:
10.1117/12.2002567
File:
PDF, 1.60 MB
english, 2013