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[IEEE 2011 IEEE International Joint Conference on Biometrics (IJCB) - Washington, DC, USA (2011.10.11-2011.10.13)] 2011 International Joint Conference on Biometrics (IJCB) - Palm vein recognition with Local Binary Patterns and Local Derivative Patterns

Mirmohamadsadeghi, Leila, Drygajlo, Andrzej
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Year:
2011
Language:
english
DOI:
10.1109/ijcb.2011.6117804
File:
PDF, 1.37 MB
english, 2011
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