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Characterization of electrochemically etched tungsten tips for scanning tunneling microscopy
Müller, A.-D., Müller, F., Hietschold, M., Demming, F., Jersch, J., Dickmann, K.Volume:
70
Year:
1999
Language:
english
DOI:
10.1063/1.1150022
File:
PDF, 529 KB
english, 1999