Evaluation of the lifetime and failure probability for...

Microelectronics Journal 1994 Vol. 25; Iss. 7

Evaluation of the lifetime and failure probability for inter-poly oxides from RVS measurements

Andreas Martin, Paula O'Sullivan, Alan Mathewson, Barry Mason, Clive Beech
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Volume:
25
Year:
1994
Language:
english
Pages:
5
DOI:
10.1016/0026-2692(94)90040-x
File:
PDF, 308 KB
english, 1994
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