Correlation of SiO2 lifetimes from constant and ramped...

Correlation of SiO2 lifetimes from constant and ramped voltage measurements

Andreas Martin, Paula O'Sullivan, Alan Mathewson
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Volume:
27
Year:
1996
Language:
english
Pages:
13
DOI:
10.1016/0026-2692(95)00100-x
File:
PDF, 871 KB
english, 1996
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