Optical characterization of epitaxial semiconductor layers: G. Bauer and W. Richter (eds), Springer, Berlin, Heidelberg, New York, ISBN: 3-540-59129-X
M. HeniniVolume:
27
Year:
1996
Language:
english
Pages:
2
DOI:
10.1016/0026-2692(96)82784-4
File:
PDF, 142 KB
english, 1996