Random vs realistic amorphous carbon models for high resolution microscopy and electron diffraction
Ricolleau, C., Le Bouar, Y., Amara, H., Landon-Cardinal, O., Alloyeau, D.Volume:
114
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4831669
File:
PDF, 3.04 MB
english, 2013