Highly stable amorphous indium-zinc-oxide thin-film...

physica status solidi (RRL) - Rapid Research Letters 2014 / 02 Vol. 8; Iss. 2

Highly stable amorphous indium-zinc-oxide thin-film transistors with back-channel wet-etch process

Luo, Dongxiang, Li, Min, Xu, Miao, Pang, Jiawei, Zhang, Yanli, Wang, Lang, Tao, Hong, Wang, Lei, Zou, Jianhua, Peng, Junbiao
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Volume:
8
Language:
english
Journal:
physica status solidi (RRL) - Rapid Research Letters
DOI:
10.1002/pssr.201308247
Date:
February, 2014
File:
PDF, 851 KB
english, 2014
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