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ECS Transactions [ECS 219th ECS Meeting - Montreal, QC, Canada (May 1 - May 6, 2011)] - Bias-Temperature Instabilities and Radiation Effects on SiC MOSFETs
Zhang, Enxia, Zhang, Cher Xuan, Fleetwood, Daniel M, Schrimpf, Ronald D., Dhar, Sarit, Ryu, Sei-Hyung, Shen, Xiao, Pantelides, Sokrates T.Year:
2011
Language:
english
DOI:
10.1149/1.3572294
File:
PDF, 141 KB
english, 2011