Raman and X-ray diffraction study of...

Thin Solid Films 2013 / 10 Vol. 545

Raman and X-ray diffraction study of (Ba,Sr)TiO3/(Bi,Nd)FeO3 multilayer heterostructures

Anokhin, A.S., Bunina, O.A., Golovko, Yu I., Mukhortov, V.M., Yuzyuk, Yu I., Simon, P.
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Volume:
545
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2013.08.057
Date:
October, 2013
File:
PDF, 571 KB
english, 2013
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