[IEEE 2013 Workshop on Fault Diagnosis and Tolerance in...

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[IEEE 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) - Los Alamitos, CA, USA (2013.08.20-2013.08.20)] 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography - Fault Model Analysis of Laser-Induced Faults in SRAM Memory Cells

Roscian, Cyril, Sarafianos, Alexandre, Dutertre, Jean-Max, Tria, Assia
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Year:
2013
Language:
english
DOI:
10.1109/fdtc.2013.17
File:
PDF, 857 KB
english, 2013
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