![](/img/cover-not-exists.png)
[IEEE 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) - Los Alamitos, CA, USA (2013.08.20-2013.08.20)] 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography - Fault Model Analysis of Laser-Induced Faults in SRAM Memory Cells
Roscian, Cyril, Sarafianos, Alexandre, Dutertre, Jean-Max, Tria, AssiaYear:
2013
Language:
english
DOI:
10.1109/fdtc.2013.17
File:
PDF, 857 KB
english, 2013