![](/img/cover-not-exists.png)
Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation
Kassies, Roel, van der Werf, Kees O., Bennink, Martin L., Otto, CeesVolume:
75
Year:
2004
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1646767
File:
PDF, 545 KB
english, 2004