[IEEE 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) - Los Alamitos, CA, USA (2013.08.20-2013.08.20)] 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography - Electromagnetic Fault Injection: Towards a Fault Model on a 32-bit Microcontroller
Moro, Nicolas, Dehbaoui, Amine, Heydemann, Karine, Robisson, Bruno, Encrenaz, EmmanuelleYear:
2013
Language:
english
DOI:
10.1109/fdtc.2013.9
File:
PDF, 390 KB
english, 2013