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[IEEE 2011 IEEE/MTT-S International Microwave Symposium - MTT 2011 - Baltimore, MD, USA (2011.06.5-2011.06.10)] 2011 IEEE MTT-S International Microwave Symposium - Challenges and approaches to on-chip millimeter wave antenna pattern measurements
Murdock, James, Ben-Dor, Eshar, Gutierrez, Felix, Rappaport, Theodore S.Year:
2011
Language:
english
DOI:
10.1109/mwsym.2011.5972965
File:
PDF, 923 KB
english, 2011