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SPIE Proceedings [SPIE Smart Materials, Nano-, and Micro-Smart Systems - Sydney, Australia (Sunday 12 December 2004)] Smart Structures, Devices, and Systems II - Residue number system scaling schemes
Kong, Yinan, Phillips, Braden, Al-Sarawi, Said F.Volume:
5649
Year:
2005
Language:
english
DOI:
10.1117/12.582137
File:
PDF, 302 KB
english, 2005