Fast and gentle side approach for atomic force microscopy

Review of Scientific Instruments 2013 Vol. 84; Iss. 12

Fast and gentle side approach for atomic force microscopy

Wessels, W. A., Broekmaat, J. J., Beerends, R. J. L., Koster, G., Rijnders, G.
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Volume:
84
Year:
2013
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4847055
File:
PDF, 804 KB
english, 2013
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