Comprehensive study of the influence of different environments on degradation processes in F8BT: Correlating optoelectronic properties with Raman measurements
Linde, Sivan, Shikler, RafiVolume:
114
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4826904
File:
PDF, 1.12 MB
english, 2013