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[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - A tester architecture suitable for MEMS calibration and testing

Ciganda, L., Bernardi, P., Reorda, M. Sonza, Barbieri, D., Straiotto, M., Bonaria, L.
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Year:
2010
Language:
english
DOI:
10.1109/TEST.2010.5699298
File:
PDF, 433 KB
english, 2010
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