[IEEE 2008 IEEE Instrumentation and Measurement Technology...

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[IEEE 2008 IEEE Instrumentation and Measurement Technology Conference - I2MTC 2008 - Victoria, BC, Canada (2008.05.12-2008.05.15)] 2008 IEEE Instrumentation and Measurement Technology Conference - A Low-Cost CMOS Integrated Dual-Mode Dual-Slope ADC with Synchronous Rectification Circuit for AC/DC Signal Measuring

Chiang, Cheng-Ta, Kao, Li-Lung, Huang, Yu-Chung
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Year:
2008
Language:
english
DOI:
10.1109/IMTC.2008.4547024
File:
PDF, 3.76 MB
english, 2008
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