Generalized analysis of quasi-steady-state and quasi-transient measurements of carrier lifetimes in semiconductors
Nagel, Henning, Berge, Christopher, Aberle, Armin G.Volume:
86
Year:
1999
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.371633
File:
PDF, 203 KB
english, 1999