Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2014 / 03 Vol. 32; Iss. 2
![](/img/cover-not-exists.png)
Enhancement of AlGaN/GaN high electron mobility transistors off-state drain breakdown voltage via backside proton irradiation
Li, Shun, Hwang, Ya-Hsi, Hsieh, Yueh-Ling, Lei, Lei, Ren, Fan, Pearton, Stephen J., Patrick, Erin, Law, Mark E., Velez Cuervo, Camilo, Smith, David. J.Volume:
32
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.4864070
Date:
March, 2014
File:
PDF, 1.69 MB
english, 2014