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Optical and structural microanalysis of GaN grown on SiN submonolayers
Riemann, T., Hempel, T., Christen, J., Veit, P., Clos, R., Dadgar, A., Krost, A., Haboeck, U., Hoffmann, A.Volume:
99
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2150589
File:
PDF, 2.09 MB
english, 2006