Optical and structural microanalysis of GaN grown on SiN...

Optical and structural microanalysis of GaN grown on SiN submonolayers

Riemann, T., Hempel, T., Christen, J., Veit, P., Clos, R., Dadgar, A., Krost, A., Haboeck, U., Hoffmann, A.

How much do you like this book?

What’s the quality of the file?

Download the book for quality assessment

What’s the quality of the downloaded files?

Volume:

Year:

2006

Language:

english

Journal:

Journal of Applied Physics

DOI:

10.1063/1.2150589

File:

PDF, 2.09 MB

english, 2006

Conversion to is in progress

Conversion to is failed