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Results of A 160 × 106 device-hour reliability assessment and failure analysis of TTL SSI integrated circuits, part 1 test results and electrical failure analysis
A.P. Kemény, G. KalmárVolume:
14
Year:
1975
Language:
english
Pages:
2
DOI:
10.1016/0026-2714(75)90161-4
File:
PDF, 4.44 MB
english, 1975