[IEEE 2008 International Conference on Electronic Materials...

  • Main
  • [IEEE 2008 International Conference on...

[IEEE 2008 International Conference on Electronic Materials and Packaging (EMAP) - Taipei, Taiwan (2008.10.22-2008.10.24)] 2008 International Conference on Electronic Materials and Packaging - Fatigue strength of electroplated copper thin films under uni-axial stress

Murata, Naokazu, Tamakawa, Kinji, Suzuki, Ken, Miura, Hideo
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2008
Language:
english
DOI:
10.1109/EMAP.2008.4784224
File:
PDF, 4.06 MB
english, 2008
Conversion to is in progress
Conversion to is failed