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Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
Aspnes, D. E., Theeten, J. B., Hottier, F.Volume:
20
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.20.3292
Date:
October, 1979
File:
PDF, 934 KB
english, 1979