Robust SEU Mitigation of 32 nm Dual Redundant Flip-Flops...

IEEE Transactions on Nuclear Science 2013 / 12 Vol. 60; Iss. 6

Robust SEU Mitigation of 32 nm Dual Redundant Flip-Flops Through Interleaving and Sensitive Node-Pair Spacing

Cabanas-Holmen, Manuel, Cannon, Ethan H., Rabaa, Salim, Amort, Tony, Ballast, Jon, Carson, Michael, Lam, Duncan, Brees, Roger
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2288090
Date:
December, 2013
File:
PDF, 1.10 MB
english, 2013
Conversion to is in progress
Conversion to is failed